NISMO

Wafer Thin Film Measurement Tool (Semiconductor)

Description: The Filmetrics F50 NIR is used to measure the thickness of dielectrics, semiconductors, and thin metal films. Measured films must be optically smooth and between 100nm to 250 microns thick (depending upon F50 model). Optical constants (n and k) can also be measured on a variety of dielectric films. Commonly measured films include semiconductor process films such as oxides, nitrides, resists, and polysilicon, optical coatings such as hardness and anti-reflection coatings, flat panel dis play films such as polyimides, resist, and cell gaps, and the various coatings used in CD and DVD manufacture. Films that can not be measured include very rough films and opaque dielectric films.Items Included:1. Filmetrics Table Top F50-NIR unit.2. PC, mouse and keyboard with installed Filmetrics Software.3. Digital version of manual on thumb drive.

Price: 20000 USD

Location: Lake Forest, California

End Time: 2025-01-04T22:25:23.000Z

Shipping Cost: N/A USD

Product Images

Wafer Thin Film Measurement Tool (Semiconductor)Wafer Thin Film Measurement Tool (Semiconductor)Wafer Thin Film Measurement Tool (Semiconductor)Wafer Thin Film Measurement Tool (Semiconductor)

Item Specifics

All returns accepted: ReturnsNotAccepted

Brand: Filmetrics

Country/Region of Manufacture: United States

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