Description: Process Variations and Probabilistic Integrated Circuit Design Please note: this item is printed on demand and will take extra time before it can be dispatched to you (up to 20 working days). Author(s): Manfred Dietrich, Joachim Haase Format: Hardback Publisher: Springer-Verlag New York Inc., United States Imprint: Springer-Verlag New York Inc. ISBN-13: 9781441966209, 978-1441966209 Synopsis Uncertainty in key parameters within a chip and between different chips in the deep sub micron area plays a more and more important role. As a result, manufacturing process spreads need to be considered during the design process. Quantitative methodology is needed to ensure faultless functionality, despite existing process variations within given bounds, during product development. This book presents the technological, physical, and mathematical fundamentals for a design paradigm shift, from a deterministic process to a probability-orientated design process for microelectronic circuits. Readers will learn to evaluate the different sources of variations in the design flow in order to establish different design variants, while applying appropriate methods and tools to evaluate and optimize their design.
Price: 73.39 GBP
Location: Aldershot
End Time: 2025-01-23T09:22:10.000Z
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Book Title: Process Variations and Probabilistic Integrated Circuit Design
Number of Pages: 252 Pages
Publication Name: Process Variations and Probabilistic Integrated Circuit Design
Language: English
Publisher: Springer-Verlag New York Inc.
Item Height: 235 mm
Subject: Computer Science, Physics
Publication Year: 2011
Type: Textbook
Item Weight: 571 g
Author: Joachim Haase, Manfred Dietrich
Item Width: 155 mm
Format: Hardcover