Description: About this Item The item is a book Paperback The Author Name is Jon Duncan Hagar The Title is IoT System Testing : An IoT Journey from Devices to Analytics and the Edge Condition New Other Comments Pages Count - 348. Binding type - Perfect. Content Language - English Category - BUSINESS & ECONOMICS / Insurance / Risk Assessment & Managem TECHNOLOGY & ENGINEERING / Telecommunications COMPUTERS / Artificial Intelligence / General Product Description - To succeed, teams must assure the quality of IoT systems. The world of technology continually moves from one hot area to another this book considers the next explosion-of IoT-from a quality testing viewpoint. You'll first gain an introduction to the Internet of Things IoT, V&V, and testing. Next, you'll be walked through IoT test planning and strategy over the full life cycle, including the impact of data analytics and AI. You will then delve deeper into IoT security testing and various test techniques, patterns, and more. This is followed by a detailed study of IoT software test labs, architecture, environments and AI. There are many options for testing IoT qualities based on the criticality of the software and risks involved each option has positives, negatives, as well as cost and schedule impacts. The book will guide start-up and experienced teams into these paths and help you to improve the testing and quality assessment of IoT systems. What You Will LearnUnderstand IoT software test architecture and planningMaster IoT security testing and test techniquesStudy IoT test lab automation and architecturesReview the need for IoT security, data analytics, AI, Neural Networks and dependability using testing and V&V Who This Book Is ForReaders with basic knowledge of software development who want to learn more about IoT testing and its intricacies, as well as companies moving into the domain of IoT, and even those already deep into the IoT domain will benefit from this book. We Use Stock Images Because we have over 2 million items for sale we have to use stock images, this listing does not include the actual image of the item for sale. The purchase of this specific item is made with the understanding that the image shown in this listing is a stock image and not the actual item for sale. For example: some of our stock images include stickers, labels, price tags, hyper stickers, obi's, promotional messages, signatures and or writing which may not be available in the actual item. When possible we will add details of the items we are selling to help buyers know what is included in the item for sale. The details  are provided automatically  from our central master database and can sometimes be wrong. Books are released in many editions and variations, such as standard edition, re-issue, not for sale, promotional, special edition, limited edition, and many other editions and versions.  The Book you receive could be any of these editions or variations. If you are looking for a specific edition or version please contact us to verify what we are selling.   Gift IdeasThis is a  great Christmas gift idea.   Hours of ServiceWe have many warehouses,  some of the warehouses process orders seven days a week, but the Administration Support Staff are located at a head office location, outside of the warehouses, and typically work only Monday to Friday. Location ID 9000z iHaveit SKU ID 165849320
Price: 88.88 USD
Location: US
End Time: 2024-12-10T17:16:51.000Z
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Restocking Fee: No
Return shipping will be paid by: Buyer
All returns accepted: Returns Accepted
Item must be returned within: 30 Days
Refund will be given as: Money Back
Fiction/Non-Fiction: Non-Fiction
Genre/Subject: BUSINESS ECONOMICS / Insurance / Risk Assessment Managem
Brand: APress
Weight: 0.61
Style: NA
Title: IoT System Testing An IoT Journey from Devices to Analytics and
Release Title: IoT System Testing An IoT Journey from Devices to Analytics and
Record Grading: New
Sleeve Grading: New
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Size: NA
Film/TV Title: IoT System Testing An IoT Journey from Devices to Analytics an
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Movie/TV Title: IoT System Testing An IoT Journey from Devices to Analytics an
UPC: 9781484282755
EAN: 9781484282755
ISBN: 9781484282755
Binding Type: Perfect
Item Height: 18.29
Main Stone: NA
Metal Purity: NA
Metal: NA
Connectivity: NA
Model: NA
Number of Pages: Xix, 326 Pages
Publication Name: Iot System Testing : an Iot Journey with Analytics to Edge Devices
Language: English
Publisher: Apress L. P.
Subject: Intelligence (Ai) & Semantics, Security / General, Telecommunications, Insurance / Risk Assessment & Management
Publication Year: 2022
Item Weight: 23.4 Oz
Type: Textbook
Author: Jon Duncan Hagar
Item Length: 10 in
Subject Area: Computers, Technology & Engineering, Business & Economics
Item Width: 7 in
Format: Trade Paperback