Description: Defect-oriented Testing for Nano-metric Cmos Vlsi Circuits, Paperback by Sachdev, Manoj; Pineda De Gyvez, Jose, ISBN 1441942858, ISBN-13 9781441942852, Like New Used, Free shipping in the US The 2nd edition of defect oriented testing has been extensively updated. New chapters on Functional, Parametric Defect Models and Inductive fault Analysis and Yield Engineering have been added to provide a link between defect sources and yield. The chapter on RAM testing has been updated with focus on parametric and SRAM stability testing. Similarly, newer material has been incorporated in fault modeling and analog testing chapters. The strength of Defect Oriented Testing for nano-Metric CMOS VLSIs lies in its industrial relevance.
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Book Title: Defect-oriented Testing for Nano-metric Cmos Vlsi Circuits
Number of Pages: Xxi, 328 Pages
Publication Name: Defect-Oriented Testing for Nano-Metric Cmos Vlsi Circuits
Language: English
Publisher: Springer
Subject: Electronics / Semiconductors, Industrial Design / General, Electronics / Circuits / Vlsi & Ulsi, Electronics / Circuits / General, Electrical
Publication Year: 2010
Type: Textbook
Item Weight: 19 Oz
Author: Manoj Sachdev, José Pineda De Gyvez
Subject Area: Technology & Engineering
Item Length: 9.3 in
Item Width: 6.1 in
Series: Frontiers in Electronic Testing Ser.
Format: Trade Paperback
