Description: Circadian Rhythms for Future Resilient Electronic Systems : Accelerated Active Self-healing for Integrated Circuits, Paperback by Guo, Xin Fei; Stan, Mircea R., ISBN 3030200531, ISBN-13 9783030200534, Like New Used, Free shipping in the US This book describes methods to address wearout/aging degradations in electronic chips and systems, caused by several physical mechanisms at the device level. The authors introduce a novel technique called accelerated active self-healing, which fixes wearout issues by enabling accelerated recovery. Coverage includes recovery theory, experimental results, implementations and applications, across multiple nodes ranging from planar, FD-SOI to FinFET, based on both foundry provided models and predictive models. Presents novel techniques, tested with experiments on real hardware;Discusses circuit and system level wearout recovery implementations, many of these designs are portable and friendly to the standard design flow;Provides circuit-architecture-system infrastructures that enable the accelerated self-healing for future resilient systems;Discusses wearout issues at both transistor and interconnect level, providing solutions that apply to both;Includes coverage of resilient aspects of emerging applications such as IoT.
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Book Title: Circadian Rhythms for Future Resilient Electronic Systems : Accelerated Active Self-Healing for Integrated Circuits
Number of Pages: Xix, 208 Pages
Language: English
Publisher: Springer International Publishing A&G
Publication Year: 2020
Topic: Systems Architecture / General, Electronics / Circuits / General
Illustrator: Yes
Genre: Computers, Technology & Engineering
Item Weight: 16 Oz
Author: Xinfei Guo, Mircea R. Stan
Item Length: 9.3 in
Item Width: 6.1 in
Format: Trade Paperback
